References - Reliability setups

Over the years Ansems Automation has built up extensive experience in various lifetime projects used for a variety of products. This includes use of serial, analog and digital interfacing with test equipment.

Different measurement setups have been made for stress testing of reflective or emissive displays, whether or not flexible. This stress testing can be done in different ways, for example by driving these displays. For these test setups a high-speed digital interface card is used to communicate with an ASIC or FPGA. The user has the ability to create his own driving patterns and voltage settings on a independent PC in their office environment. By measuring e.g. OLED displays, the emitted intensity during the experiment is read and logged to a central database. The test owner can generate different reports to get an insight into the degradation of the samples in test. Another way of stressing these displays is by rolling and unrolling them several times in a roll setup. The number of rolls during this test is also logged in a central database.

Besides the operational stress tests, also measurement setups have been built to stress test structures or products electronically. Very often a pulsed voltage is applied to the devices under test during the whole lifetime period. At certain points in time a comprehensive sweep test is done to characterize the device under test.